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XRF THIN-FILM WINDOW TECHNICAL INFORMATION SPECTROCERTIFIED® THIN-FILM SAMPLE SUPPORT
WINDOW MATERIALS

A thin-film sample support window is a substance used for retaining liquid, powdered, slurry or solid specimens in XRF Sample Cups. Of the many different types of materials available, few possess the necessary combination of consistency and chemical and physical properties to serve x-ray spectrochemical needs.

Typical Thickness Variations

Variations

   

Uniformity of Thickness

   

Orientation

Between packages

   

≤1 – 2%

   

Multiaxially orientated; minimizes effects of preferred orientation Between lots ≤± 5%

Between lots

   

≤± 5%

   

Multiaxially orientated; minimizes effects of preferred orientation Between lots ≤± 5%


Physical Characteristics

Thin-Film Substances

   

Melting Point,°C (°F)

   

Density, gm/cc

   

Structural Formula

Etnom®

   

270 (518)

   

1.36

   

C14H10O4

Prolene®

   

165 (329)

   

0.91

   

C3H6

Mylar®

   

260 (500)

   

1.38

   

C10H3O4

Polypropylene

   

160 (320)

   

0.91

   

C3H6

Ultra-Polyester®

   

210 (410)

   

0.93

   

C10H3O4

Polyimide (Kapton®)

   

None reported

   

1.42

   

C20H10O5N2

Polycarbonate

   

267 (513)

   

1.37

   

C2H3F


Purity

(Refer to “How to Select Thin-Films” for Additional Information)

Thin-Film Substance

   

Trace Impurities, PPM

Mylar®, Ultra-Polyester®

   

Ca, P, Sb, Fe, Zn

Prolene®, Polypropylene

   

Ca, P, Fe, Cu, Zr, Ti, Al

Etnom®

   

Si, Ca, P, Zn,  Sb

Polyimide (Kapton®)

   

Unknown

Polycarbonate

   

Unknown


CAUTION: All thin-film window materials affixed to sample cups present the risk of stretching or rupturing in the sample chamber and/or causing sample cup leakage through the ring and cell juncture or disassembly with potential contamination and damage to the system. Additionally, the possibility of pinholes, pores and depressions existing in any thin-film sample support substance regardless of form, configuration and packaging can present leakage of a sample with subsequent contamination, costly clean-ups and damage to the analytical instrumentation and it components. 

Chemplex Industries, Inc. is not the manufacturer of any thin-film substance and assumes no responsibility of the product substance as provided. It is strongly recommended that the products used be subject to judicious testing, use and applications and user evaluation prior to actual use by a method that does not risk contamination, costly clean-ups or damage to the x-ray analytical spectrometer. The responsibility of product purchase, acceptance and performance resides totally with the user. Chemplex Industries, Inc. assumes no liability or guarantees whatsoever that the products will perform in accordance with their usage, advertisements or methodologies written, orally expressed or insinuated.

® SpectroCertified, Prolene, Ultra-Polyester, Etnom and Chemplex are registered trademarks of Chemplex Industries, Inc.
® Mylar and Kapton are registered trademarks of E.I. DuPont de Nemours Inc.